Delft University of Technology researchers have investigated hexagonal microtextured glass superstrates for nc-Si:H single-junction PV cells to analyse diffraction behaviour and absorptance response. The fabricated dataset has included 75 textured wafers with periodicities of 3 µm, 4 µm, and 5 µm, where the HP5 texture has reached about 1.0 µm height or 1012 nm. Device structures were fabricated using 150 nm IOH layers with approximately 21 Ω/sq sheet resistance, 60 nm i-ZnO reflectors, and 300 nm Ag layers within a defined nc-Si:H architecture. Electrical testing was conducted under AM1.5G illumination at 100 mW/cm2 using J-V measurements, where key devices incorporated about 3200 nm absorber thickness and achieved 28.6 mA/cm² Jsc alongside 9.3 % PV conversion efficiency. Optical characterisation has included Raman microscopy, diffused and total transmission measurements, angular intensity distribution analysis, and laser diffraction patterns to quantify diffraction-driven scattering behaviour.